International Conference on Design Automation and Test in Europe (DATE 2017), Lausanne Swiss


– Dr. Chen attended the International Conference on Design Automation and Test in Europe (DATE) 2017 at Lausanne Swiss.
 
– We also received the Best Paper Award for the embedded system track.


The Conference Site of DATE 2016

Dr. Xiang Chen, Dr. Yiran Chen, and Kent Nixon
receiving the Best Paper Award